MTA sampling kits can be used to take material from suspect surfaces, including deposits, and corroded or discolored areas. Samples can be obtained by removing individual pin stubs from kit using supplied specialty tweezers and returning used pin stub to kit. Circumstances of collection, and any other relevant information, can be noted on forms provided. Once returned to MTA, pin stubs will be examined under a high-powered stereoscopic microscope, followed by a more detailed surface examination and chemical analysis using our scanning electron microscope (SEM).

If necessary, Fourier-Transform Infrared Spectroscopy (FTIR) can be used to identify non-metallic materials, including plastics and other polymers, like Teflon, Nylon, polyethylene and polypropylene, as well as molecular radicals such as acetates.