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Scanning Electron Microscope
with Energy Dispersive X-Ray Detector
for Element Analysis
The Zeiss-LEO scanning electron microscope (SEM) is our workhorse instrument, used for examining in more detail surfaces previously examined under our Lietz high-performance optical stereoscope. The SEM work area, with large wall display, offers a comfortable work space for visiting clients.
SEM analysis provides us with very detailed, high-resolution images across a wide range of magnifications for a varity of sample types. This depth of analysis is what makes the Ziess-LEO so invaluable.
Our SEM analysts can utilize this impressive analytical capability across many disciplines. including failure analysis and custom analysis on surface contamination samples for specific industries.
X-ray Detector
Figure 1: Use of Scanning Electron Microscope to study surface detail at high magnification
Figure 2: Deterioration of stainless steel support rail on paving on the outside of swimming pool
Figure 3: Detail of oxidation and pitting corrosion of the stainless steel surface
X100
Figure 4: The corroded surface at a magnification of X3,000 under the scanning electron microscope show the formation of crystals due to the evaporation of the swimming pool water containing chlorine.
Figure 5: The X-ray analysis from the detector shows that the crystals seen in Figure 4 are sodium chloride. The reddish-brown corrosion product has iron, chromium, and oxygen from the corroded stainless steel. No molybdenum is detected. Stainless steels without molybdenum are particularly susceptible to pitting corrosion in the presence of chlorides.
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