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Scanning Electron Microscope with
Energy Dispersive X-Ray Detector
for Element Analysis
Our Zeiss-LEO scanning electron microscope (SEM) is a workhorse instrument which we utilize in examining in more detail surfaces that have previously been examined under our Lietz high performance optical stereoscope. Our comfortable SEM area includes a large wall display, making for a comfortable work space for visiting clients.
SEM analysis provides us with very detailed, high-resolution images across a wide range of magnifications on a varity of sample types. This depth of analysis is what makes the Ziess-LEO so invaluable.
Our SEM analysts can utilize this impressive analytical capability across many disciplines. including failure analysis and custom analysis on surface contamination samples for specific industries.
X-ray Detector
Figure 1: Use of Scanning Electron Microscope​ to study surface detail at high magnification​
Figure 2: Deterioration of stainless steel support rail ​on paving on the outside of swimming pool
Figure 3: Detail of oxidation and pitting corrosion of the stainless steel ​surface
X 100
Figure 4: The corroded surface at a magnification of X 3,000 under the scanning electron microscope show the formation of crystals due to the evaporation of the swimming pool water containing chlorine.
Figure 5: The X-ray analysis from the detector shows that the crystals seen in Figure 4 are sodium chloride. The reddish-brown corrosion product has iron, chromium, and oxygen from the corroded stainless steel. No molybdenum is detected.​ Stainless steels without molybdenum are particularly susceptible to pitting corrosion in the presence of chlorides.
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