Scanning Electron Microscopy (SEM)

The team at MTA operate two scanning electron microscopes. LEO, built by Lietz Electron Optics and Karl Zeiss is the laboratory’s workhorse instrument. LEO with variable pressure handles the routine failure analysis work and is integrated with a Thermo Fisher energy dispersive X-ray silicon drift detector for analyzing elemental composition. Apart from point analysis,  the system can also carry out line scans and element mapping so important to many investigations.