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Scanning Electron Microscope Sampling Kits
The pin stubs provided in our sampling kits feature conductive carbon adhesive, which may be used to collect solid particles from deposits, other surface contamination, and samples of debris obtained from contaminated lubricants, such as might be used in bearings, to send to MTA for examination and analysis. After a throrough visual inspection, samples are examined using our scanning electron microscope (SEM).
Collection Kit Includes:
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8 pin stubs with conductive carbon adhesive
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​Specialized curved tweezers
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4 sample boxes to return samples to lab
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4 sample collection note sheets
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Instructional postcard
Conductive carbon adhesive on pin stub (with protective white cover removed)
Curved tweezers
Pin stub featuring
collected debris
Debris has been sputter coated for
examination under the SEM
The SEM has both, secondary and backscatter detectors, as well as an X-ray detector, to determine elemental composition.
A comfortable working area with large overhead monitor facilitates easy interaction between client and Senior SEM Analyst.
Serving:
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Semiconductor & Microelectronics
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Medical Device & Biotechnology
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Aerospace, Defense & Energy
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Marine Engineering & Infrastructure
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Shipyards & Marine Services
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HVAC & Mechanical Systems
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Construction & Infrastructure
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Ceramics
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Polymer Manufacturing
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Additive & 3D Printing Manufacturing
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Robotics
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Machine Shops
Instructions for Collecting Samples
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Use specialized curved tweezers included to firmly grip grooved edge of pin stub head. See Figure 1​
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Remove white disc adhesive sticker cover, exposing
adhesive surface.
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Press adhesive surface to target area, applying light,
even pressure.
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Avoid scraping or dragging, which can damage samples.
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Return pin stub to mount corresponding to the number printed on the underside
of pin stub head.
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Use enclosed comment card to record any notes in the box corresponding to the number located on both underside of pin stub head and mount position within collection kit.
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